Towards a robust and efficient EM based authentication of FPGA against counterfeiting and recycling

Counterfeiting of integrated circuits (IC) has become a serious concern for semiconductor industry. It is necessary to find a robust solution which is both efficient and low cost in terms of implementation in order to detect and avoid the counterfeiting of ICs. Also, the solution must be resistant against aging and other reliability effects. In this paper we have proposed a scheme to utilize radiated Electromagnetic (EM) emission from the IC to create a fingerprint. Our proposed scheme exploits manufacturing based process variation (PV), which continues to dominate in the nanoscale technologies. We have deployed variability-aware circuit (VAC) design that generates radiated EM emission and performs realistic assessment of the PV effects. Generated EM response is treated to different encoding metrics to quantize it as a fingerprint for the IC. Latter part of the paper validates that the fingerprint is stable after the aging effects of IC. To validate our proposed scheme measurements are carried out over several FPGA boards.

[1]  Sheldon X.-D. Tan,et al.  EM-based on-chip aging sensor for detection and prevention of counterfeit and recycled ICs , 2015, 2015 IEEE/ACM International Conference on Computer-Aided Design (ICCAD).

[2]  B. Preneel,et al.  Differential Electromagnetic Attack on an FPGA Implementation of Elliptic Curve Cryptosystems , 2006, 2006 World Automation Congress.

[3]  Kaushik Roy,et al.  Parameter Variation Tolerance and Error Resiliency: New Design Paradigm for the Nanoscale Era , 2010, Proceedings of the IEEE.

[4]  Mark Mohammad Tehranipoor,et al.  Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain , 2014, Proceedings of the IEEE.

[5]  Srinivas Devadas,et al.  Physical Unclonable Functions and Applications: A Tutorial , 2014, Proceedings of the IEEE.

[6]  Benedikt Heinz,et al.  Localized electromagnetic analysis of RO PUFs , 2013, 2013 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST).

[7]  Mark Mohammad Tehranipoor,et al.  Aging analysis for recycled FPGA detection , 2014, 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT).

[8]  G. Edward Suh,et al.  Physical Unclonable Functions for Device Authentication and Secret Key Generation , 2007, 2007 44th ACM/IEEE Design Automation Conference.

[9]  M. Zolfaghari-Nejad,et al.  Weighted Hamming distance for PUF performance evaluation , 2013 .