Novel dielectric anomaly in the hole-doped La(2)Cu(1-x)Li(x)O(4) and La(2-x)Sr(x)NiO(4) insulators: signature of an electronic glassy state.

The low-frequency dielectric response of hole-doped insulators La(2)Cu(1-x)Li(x)O(4) and La(2-x)Sr(x)NiO(4) shows a large dielectric constant epsilon(') at high temperature and a steplike drop by a factor of 100 at a material-dependent low temperature T(f). T(f) increases with frequency, and the dielectric response shows universal scaling in a Cole-Cole plot, suggesting that a charge-glass state is realized both in the cuprates and in the nickelates.