论文信息 - Percolation Phenomena in Silicon - Based Nanocrystalline Systems

Percolation Phenomena in Silicon - Based Nanocrystalline Systems

The present paper analyzes the appearance of voltage percolation thresholds in the current-voltage characteristics measured on silicon-based nanocrystalline systems that present random space distribution of the nanocrystallites. This percolation phenomenon is explained on the basis of the probability of tunneling under applied bias and is related to the samples microstructure.

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