论文信息 - Correction of errors owing to thermal elongation of high temperature coaxial probe for microwave permittivity measurement

Correction of errors owing to thermal elongation of high temperature coaxial probe for microwave permittivity measurement

A method for correcting errors owing to the thermal elongation of high temperature coaxial probe for microwave permittivity measurement has been developed. The method has been verified by measuring the open circuit permittivity of the probe which operates up to 1200°C.

T. E. Cross | M. Arai | J.G.P. Binner

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