Optical beam testing and its potential for electronic device characterization
暂无分享,去创建一个
[1] A. Rosencwaig. Thermal wave microscopy with photoacoustics , 1980 .
[2] J. Quincke,et al. Circuit Analysis In ICS Using The Scanning Laser Microscope , 1989, Other Conferences.
[3] Christian Boit,et al. Quantitative emission microscopy , 1992 .
[4] Y. Tsuchiya,et al. Non-Contact Picosecond Electro-Optic Sampling Utilizing Semiconductor Laser Pulses , 1990, Optics & Photonics.
[5] G. Sölkner,et al. Laser diode based electro‐optic measurement system with high voltage resolution , 1993 .
[6] J. Monchalin. Optical Detection of Ultrasound , 1986, IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control.
[7] H. K. Heinrich,et al. Picosecond noninvasive optical detection of internal electrical signals in flip-chip-mounted silicon integrated circuits , 1990 .
[8] J. Whitaker,et al. Picosecond switching time measurement of a resonant tunneling diode , 1988 .
[9] G. Chui,et al. Picosecond photoelectron microscope for high-speed testing of integrated circuits , 1990 .
[10] Brian H. Kolner,et al. Electrooptic Sampling of GaAs Integrated Circuits , 1986, Topical Meeting on Ultrafast Phenomena.
[11] H. Engan. Phase sensitive laser probe for high-frequency surface acoustic wave measurements , 1978 .
[12] J. Whitaker,et al. Experimental characterization of external electrooptic probes , 1991, IEEE Microwave and Guided Wave Letters.
[13] Reinhold Dipl.-Ing. Schmitt,et al. Flexible picosecond probing of integrated circuits with chopped electron beams , 1990 .
[14] Gerard Mourou,et al. Noncontact electro-optic sampling with a GaAs injection laser , 1986 .
[15] G. Sölkner,et al. Phase-preserving imaging of high frequency surface acoustic wave fields , 1989 .
[16] A. Korpel,et al. Probing of acoustic surface perturbations by coherent light. , 1969, Applied optics.
[17] Robert S. Schwartz,et al. Solid Logic Technology: Versatile, high-performance microelectronics , 1964, IBM J. Res. Dev..
[18] H. K. Heinrich,et al. Picosecond backside optical detection of internal signals in flip-chip mounted silicon VLSI circuits , 1992 .
[19] Rolf Clauberg,et al. Picosecond photoemission probing of integrated circuits: capabilities limitations, and applications , 1990 .
[20] H. K. Heinrich,et al. Noninvasive sheet charge density probe for integrated silicon devices , 1986 .
[21] Kees de Kort,et al. Waveform measurements with calibrated amplitude by electro-optic sampling in IC's , 1992 .
[22] D. W. Pohl,et al. Scanning Near-Field Optical Microscopy (SNOM*): Basic Principles And Some Recent Developments , 1988, Photonics West - Lasers and Applications in Science and Engineering.
[23] Siegfried Görlich. Electron beam testing versus laser beam testing , 1992 .