Multi-ring active analogic protection for minority carrier injection suppression in smart power technology

Minority-carrier injection is one of the major causes of redesign in Smart Power technology. This parasitic current generated during the power stage turn off can be the source of dramatic failure such as latch-up. We propose in this paper a new protection structure able to significantly reduce the parasitic current flowing through the substrate. This new protection structure called MAAP (Multi-ring Active Analogic Protection) is self triggered by the injected current, is fully compatible with the standard technological process and reduces the parasitic current by 3 decades.

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