Low resolution slit-scan pattern recognition applying one-dimensional multiparameter analysis

Abstract For the rapid pre-screening of gynecological cell samples, the Battelle system uses the slit-scan technique within the first decision level to extract different features from fluorescently stained cells. After various artifacts have been eliminated by signal thresholding, the alarm detection is performed, based on a seven-dimensional linear discriminant analysis. Compared to methods which use the DNA fluorescence as a significant feature, this procedure delivers a lower number of alarms which have to be checked by high resolution image analysis techniques; however the number of identified atypical cells is the same.