TiDeVa: A Toolbox for the Automated and Robust Analysis of Time-Dependent Variability at Transistor Level

Time-Dependent Variability has attracted increasing interest in the last years. In particular, time-dependent phenomena such as Bias Temperature Instability, Hot Carrier Injection and Random Telegraph Noise can have a large impact on circuit reliability, and must be therefore characterized and modeled. For technologies in the nanometer range, these phenomena reveal a stochastic behavior and must be characterized in a massive manner, with enormous amounts of data being generated in each measurement. In this work, a novel tool with a user-friendly interface, which allows the robust and fully-automated parameter extraction for RTN, BTI and HCI experiments, is presented.

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