Spatial clustering of defect luminescence centers in Si-doped low resistivity Al0.82Ga0.18N
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M. Kneissl | M. Weyers | R. Martin | A. Knauer | P. Edwards | G. Kusch | T. Wernicke | C. Trager-Cowan | V. Kueller | G. Naresh-Kumar | M. Nouf-Allehiani | C. Kuhn | F. Mehnke