A 1.2V 6.4GHz 181ps 64-bit CD domino adder with DLL measurement technique
暂无分享,去创建一个
Charlie Chung-Ping Chen | Hsien-Chen Chiu | Min-Han Hsieh | Chia-Ming Liu | Yu-Shun Wang | Yi-Chi Wu | Bing-Feng Lin
[1] Niraj K. Jha. Testing for multiple faults in domino-CMOS logic circuits , 1988, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
[2] B. Nikolic,et al. A 240ps 64b carry-lookahead adder in 90nm CMOS , 2006, 2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers.
[3] Shen-Iuan Liu,et al. A 0.5–5-GHz Wide-Range Multiphase DLL With a Calibrated Charge Pump , 2007, IEEE Transactions on Circuits and Systems II: Express Briefs.
[4] Janusz Rajski,et al. High-frequency, at-speed scan testing , 2003, IEEE Design & Test of Computers.
[5] B. Bloechel,et al. A 4GHz 300mW 64b integer execution ALU with dual supply voltages in 90nm CMOS , 2004, 2004 IEEE International Solid-State Circuits Conference (IEEE Cat. No.04CH37519).
[6] Eric Lindbloom,et al. Transition Fault Simulation , 1987, IEEE Design & Test of Computers.
[7] Edward J. McCluskey,et al. Condensed Linear Feedback Shift Register (LFSR) Testing—A Pseudoexhaustive Test Technique , 1986, IEEE Transactions on Computers.
[8] Edward J. McCluskey. Verification Testing - A Pseudoexhaustive Test Technique , 1984, IEEE Trans. Computers.
[9] Nandu Tendolkar,et al. Novel techniques for achieving high at-speed transition fault test coverage for Motorola's microprocessors based on PowerPC/spl trade/ instruction set architecture , 2002, Proceedings 20th IEEE VLSI Test Symposium (VTS 2002).
[10] S.H. Dhong,et al. 470 ps 64-bit parallel binary adder [for CPU chip] , 2000, 2000 Symposium on VLSI Circuits. Digest of Technical Papers (Cat. No.00CH37103).