Virtual Reality approach for nanoparticles tracking using simulated forces

In this paper we propose a Virtual Reality (VR) approach to track the nanoparticle movement using simulated forces. As a first step in this direction we have considered the representation of the interaction between nanoparticles and Atomic Force Microscope (AFM) tip. This involved the computation of both long and short-range forces. In particular, the forces considered in the simulation include Van der Waals, adhesive, capillary, gravitational, electrostatic, and frictional forces. These forces were calculated using standard equations with MatLab and are provided as input to the VR software (EONReality) for the representation of the direction of the particle movement. The VR visualization and control of the magnitude and direction of these forces is demonstrated.