Reliability prediction using nondestructive accelerated-degradation data: case study on power supplies

This paper describes a conceptual framework for reliability evaluation from nondestructive accelerated degradation data (NADD). A numerical example of data sets from power supply units for electronic products is presented using this framework. The authors model NADD as a collection of stochastic processes for which the parameters depend on the stress levels. The relationship between these parameters and the associated stresses is explored using regression. The failure-time of power-supply units is modeled by the Birnbaum-Saunders distribution, for which the confidence bounds and tolerance limits can be easily obtained.