Photoelectron diffraction for probing valency and magnetism of 4f -based materials: A view on valence-fluctuating EuIr2Si2
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C. Krellner | E. Chulkov | K. Kummer | C. Geibel | D. Usachov | D. Vyalikh | S. Seiro | I. Tupitsyn | M. Muntwiler | K. Kliemt | C. Laubschat | S. Fujimori | K. A. Bokai | S. Schulz | G. Poelchen | Hang Li | A. V. Tarasov | N. Caroca-Canales | M. Mende