Common-path speckle interferometer for phase objects studies

Abstract A very stable and robust schema for electronic speckle pattern interferometry configured to be sensible out-of-plane for studying phase objects is presented. It is based on a 4 f imaging optical system, consisting of two windows in the object plane and a Ronchi ruling in the Fourier plane. One of the windows attends as a reference and the other acts as a probe arm. The speckle effect is created when a ground glass diffuser is placed in the object plane. Phase stepping is achieved out by Ronchi ruling translation, which is operated manually and validated with the Carre method. Analytic explanation and experimental results are shown.

[1]  Cruz Meneses-Fabian,et al.  One-shot phase-shifting phase-grating interferometry with modulation of polarization: case of four interferograms. , 2008, Optics express.

[2]  Pramod Rastogi,et al.  Digital Speckle Pattern Interferometry and Related Techniques , 2000 .

[3]  Héctor Rabal,et al.  Application of dynamic speckle interferometry to the drying of coatings , 2001 .

[4]  John R. Tyrer,et al.  Two-dimensional strain measurement with ESPI , 1996 .

[5]  David Kerr,et al.  Electronic speckle contouring , 1992 .

[6]  Donald J. Nevins,et al.  Analysis of the vibration mode of apple tissue using electronic speckle pattern interferometry , 2001 .

[7]  J. Alpuente-Hermosilla,et al.  EMPIRICAL CHARACTERIZATION OF WOOD SURFACES BY MEANS OF ITERATIVE AUTOCORRELATION OF LASER SPECKLE PATTERNS , 2008 .

[8]  P. Carré.  Installation et utilisation du comparateur photoélectrique et interférentiel du Bureau International des Poids et Mesures , 1966 .

[9]  Cruz Meneses-Fabian,et al.  Common-path phase-shifting interferometer with binary grating , 2006 .

[10]  Mingguang Shan,et al.  Parallel two-step spatial carrier phase-shifting common-path interferometer with a Ronchi grating outside the Fourier plane. , 2013, Optics express.

[11]  Zhigang Zang,et al.  Analysis of optical switching in a Yb3+-doped fiber Bragg grating by using self-phase modulation and cross-phase modulation. , 2012, Applied optics.

[12]  Victor Arrizón,et al.  Common-path interferometry with one-dimensional periodic filters. , 2004, Optics letters.

[13]  M. Takeda,et al.  Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry , 1982 .

[14]  R. Spooren,et al.  Measuring mixing dynamics of transparent fluids with electronic speckle pattern interferometry. , 1997, Applied optics.

[15]  Cruz Meneses-Fabian,et al.  Optical tomography with parallel projection differences and Electronic Speckle Pattern Interferometry , 2003 .

[16]  Zhigang Zang,et al.  Numerical analysis of optical bistability based on Fiber Bragg Grating cavity containing a high nonlinearity doped-fiber , 2012 .

[17]  Cruz Meneses-Fabian,et al.  Optical tomography of transparent objects with phase-shifting interferometry and stepwise-shifted Ronchi ruling. , 2006, Journal of the Optical Society of America. A, Optics, image science, and vision.

[18]  Juan A Rayas,et al.  Three-dimensional deformation measurement from the combination of in-plane and out-of-plane electronic speckle pattern interferometers. , 2004, Applied optics.

[19]  K. Creath.  Phase-Shifting Speckle Interferometry , 1985, Optics & Photonics.

[20]  J. A. Rayas,et al.  Medición de la evolución temporal de los campos dinámicos de desplazamiento mediante interferometría de moteado para una probeta de latón , 2010 .

[21]  Zhigang Zang,et al.  Low-switching power (<45 mW) optical bistability based on optical nonlinearity of ytterbium-doped fiber with a fiber Bragg grating pair , 2012 .

[22]  Chih-Kung Lee,et al.  Phase-shifting algorithms for electronic speckle pattern interferometry. , 2002, Applied optics.

[23]  Hedser H. van Brug.  Phase-step calibration for phase-stepped interferometry , 1999 .

[24]  P V Farrell,et al.  Speckle interferometry in transparent media. , 1986, Applied optics.

[25]  Mingguang Shan,et al.  Common-path interferometer with a tri-window. , 2012, Optics letters.