Efficient calibration algorithm, and calibration pattern for correcting distortions for three-dimensional image acquisition systems for microscopic applications

We present novel method for fully automated detection of calibration features. It reduces computation effort when compared to traditional corner, edge, and conic detection algorithms. Our method employs generalized method based on properties of prospective projection invariants [1], but is also applicable for the optical systems suffering high order, non-spherical distortions. We also show an example when in presence of significant barrel distortion procedure developed for ideal pinhole camera system outlined in [1] does not converge to unique solution. We suggest new modified algorithm which produces unique solution.

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