论文信息 - Data set for fabrication of conformal two-dimensional TiO2 by atomic layer deposition using tetrakis (dimethylamino) titanium (TDMAT) and H2O precursors - 字舞流文

Data set for fabrication of conformal two-dimensional TiO2 by atomic layer deposition using tetrakis (dimethylamino) titanium (TDMAT) and H2O precursors

Zhenyin Hai | S. Zhuiykov | C. Xue | Hongyan Xu | L. Hyde | M. Akbari

[1] M. K. Akbari,et al. Wafer-scale fabrication of conformal atomic-layered TiO2 by atomic layer deposition using tetrakis (dimethylamino) titanium and H2O precursors , 2017 .

[2] K. D. Verma,et al. Determination of the optical constants and film thickness of ZnTe and ZnS thin films in terms of spectrophotometric and spectroscopic ellipsometry , 2016 .

[3] R. Chtourou,et al. Photocatalytic activity of TiO2 nanofibers sensitized with ZnS quantum dots , 2013 .

[4] D. Suvorov,et al. Nanocrystalline TiO2 Thin Films Fabricated Via a Polyelectrolyte Multilayer‐Assisted Sol–Gel Reaction , 2010 .

[5] D. King,et al. Quantum confinement in amorphous TiO2 films studied via atomic layer deposition , 2008, Nanotechnology.

[6] G. Oskam,et al. Phase-pure TiO2 nanoparticles: anatase, brookite and rutile , 2008, Nanotechnology.

[7] T. Wágner,et al. Optical properties of amorphous (As0.33S0.67)100−xTex (x = 0, 1, 5 and 10) chalcogenide thin films, photodoped step-by-step with silver , 2008 .

[8] S. Manorama,et al. Bandgap studies on anatase titanium dioxide nanoparticles , 2003 .

[9] Craig M. Herzinger,et al. Ellipsometric determination of optical constants for silicon and thermally grown silicon dioxide via a multi-sample, multi-wavelength, multi-angle investigation , 1998 .