论文信息 - Sensitivity analysis of calibration standards for fixed probe spacing on-wafer calibration techniques [vector network analyzers]

Sensitivity analysis of calibration standards for fixed probe spacing on-wafer calibration techniques [vector network analyzers]

In vector network analyzer calibration, it is clear that the uncertainty in the standard definition leads to inaccurate measurement. We investigate the sensitivity of different on-wafer calibration techniques to probe positioning. Calibration comparison derived error-bounds are calculated for various cases differing only by a single change in probe/standard overlap.

A.M.E. Safwat | L. Hayden

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