21‐2: Highly Reliable Amorphous Indium‐Gallium‐Zinc‐Tin‐Oxide TFTs with Back‐Channel‐Etch Structure
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Guangcai Yuan | Hehe Hu | Xinhong Lu | Ke Wang | Yinglong Huang | Wenlin Zhang | Ce Ning | Zhanfeng Cao | Wei Yang | Qijun Yao | Jiushi Wang