Surface chemistry and preferential crystal orientation on the H and Cl terminated silicon surface

Surface chemistry and determining factors of the preferential crystal orientation are discussed through the deposition studies on hydrogenated chlorinated crystalline silicon films by rf plasma-enhanced chemical vapor deposition of a dichlorosilane, SiH2Cl2, and H2 mixture. The growth of randomly oriented crystal Si films occurred from the initial growth stage. On the other hand, the incubation layer of amorphous Si was formed in the initial stage, and subsequently, the growth of (220) preferred crystal orientation proceeded. They are determined by the thermal abstraction of H from the growing surface at substrate temperature above 350°C. Higher degree of Cl termination was effective in suppressing the oxygen incorporation into the Si network, although it did not contribute directly to the preferred crystal orientation. The insertion of atomic hydrogen to the Si–Si back bond in the subsurface region promoted the SiHClx complex formation, which was the most possible nucleation site for promoting the (220) ...

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