论文信息 - Curvilinear property measurement and computation methods for physical verification of bent waveguides in photonic integrated circuit layouts

Curvilinear property measurement and computation methods for physical verification of bent waveguides in photonic integrated circuit layouts

We discuss why electronic design automation tools need new functionality to perform curvilinear layout feature validation of photonic integrated circuits. We evaluate and test different algorithms for curvilinear path length and curvature measurement.

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