论文信息 - Threshold voltage and leakage current variability on process parameter in a 22nm PMOS Device - 字舞流文

Threshold voltage and leakage current variability on process parameter in a 22nm PMOS Device

P. Menon | A. Zain | I. Ahmad | A. Maheran | Z. A. Faizah | F. Salehuddin | Nuraini M. Sayed