Minimum Detectable Signals Of Integrated Magnetic Sensors In Bulk Cmos And SOI Tech Nologies For Magnetic Read Heads

Two of the most important factors in dictating the popularity of integrated magnetic sensors are the ease of fabrication and the signal to noise ratio of the devices. Sensors fabricated in both bulk CMOS and SO1 technologies enjoy the benefit of ease of fabrications. In this paper, we study the signal to noise ratios of various CMOS magnetic sensors. We show that the minimum detectable signal (MDS) for split-drain magnetic sensor is proportional to Si'I -3/2 while that for LCDM and LTM in SO1 technologies are S,-'l

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