Dynamic Guardband Selection: Thermal-Aware Optimization for Unreliable Multi-Core Systems

Circuit aging has become the major reliability concern in current and upcoming technology nodes. For instance, Bias Temperature Instability (BTI) leads to an increase in the threshold voltage of a transistor. That, in turn, may prolong the critical path delay of the processor and eventually may lead to timing errors. In order to avoid aging-induced timing errors, designers employ guardbands either with respect to voltage or frequency. State-of-the-art techniques determine a guardband type at the circuit level at design time irrespective from the running workload at the system level. Our investigation revealed that generated temperatures by a running workload have the potential to play a key role in determining the appropriate guardband type with respect to system performance. Therefore, we propose a paradigm shift in designing guardbands: to select the guardband types on-the-fly with respect to the workload-induced temperatures aiming at optimizing for performance under temperature and reliability constraints. Moreover, different guardband types for different cores can be selected simultaneously when multiple applications with diverse properties suggest this to be useful. Our dynamic guardband selection allows for a higher performance compared to techniques that employ a fixed (at design time) guardband type throughout.