Quantification of void networks of as-sprayed and annealed nanostructured yttria-stabilized zirconia (YSZ) deposits manufactured by suspension plasma spraying
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P. Fauchais | G. Montavon | J. Ilavsky | S. Valette | A. Denoirjean | A. Bacciochini | F. Ben-Ettouil | E. Brousse
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