Ultimate low cost analog BIST

In this work a BIST method for linear analog circuits with very low cost and the smallest possible analog overhead area is presented. The method is suitable to be implemented in the SoC environment, as it allows the reuse of resources already available in the system, and it is essentially digital. Theoretical background is provided, and experimental results demonstrate the advantages and limits of the proposed approach.

[1]  Yervant Zorian,et al.  System chip test: how will it impact your design? , 2000, Proceedings 37th Design Automation Conference.

[2]  José Luis Huertas,et al.  Analog and mixed-signal benchmark circuits-first release , 1997, Proceedings International Test Conference 1997.

[3]  S.M. Kay,et al.  Spectrum analysis—A modern perspective , 1981, Proceedings of the IEEE.

[4]  Francesco Corsi,et al.  Mixed-Signal Circuit Classification in a Pseudo-Random Testing Scheme , 2002, J. Electron. Test..

[5]  John G. Proakis,et al.  Probability, random variables and stochastic processes , 1985, IEEE Trans. Acoust. Speech Signal Process..

[6]  Bruno O. Shubert,et al.  Random variables and stochastic processes , 1979 .

[7]  Kwang-Ting Cheng,et al.  Characterization of a pseudo-random testing technique for analog and mixed-signal built-in-self-test , 2000, Proceedings 18th IEEE VLSI Test Symposium.

[8]  Luigi Carro,et al.  Testing analog circuits using spectral analysis , 2003, Microelectron. J..

[9]  Luigi Carro,et al.  Ultra low cost analog BIST using spectral analysis , 2003, Proceedings. 21st VLSI Test Symposium, 2003..