Impact of chamber pressure and Si-doping on the surface morphology and electrical properties of homoepitaxial (100) β-Ga2O3 thin films grown by MOVPE
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M. Albrecht | J. Schwarzkopf | A. Fiedler | W. Miller | K. Irmscher | Z. Galazka | S. Bin Anooz | M. Albrecht | R. Schewski | C. Wouters | A. Popp | R. Grüneberg | S. B. Anooz | T. Chou