STarS: a target switching algorithm for sequential test generation

The authors introduce a new deterministic test pattern generation algorithm for sequential circuits. The Sequential Target Switching (STarS) algorithm begins generating a test sequence for a specific target fault, but as each pattern is generated, it keeps track of the set of faults that may also use this sequence as part of a test. Backtracking is avoided by switching the target fault to a member of this fault set, and partial sequences are re-used as much as possible.<<ETX>>

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