Experimental study of phase noise in FBAR resonators

Phase noise of micromachined bulk acoustic wave resonators is investigated. A measurement bench, able to characterize the phase noise of a single resonator on-wafer, is set up. The experimental data demonstrate the existence of a 1/f phase noise component, the amplitude of which is strongly dependent on the resonator geometry. Particularly, the apodized resonators have shown the best phase noise performance, with no degradation of the Q factor

[1]  R. Plana,et al.  Optimization of an ultra low-phase noise sapphire-SiGe HBT oscillator using nonlinear CAD , 2004, IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control.

[2]  D. Leeson A simple model of feedback oscillator noise spectrum , 1966 .

[3]  F. L. Walls,et al.  A new model of 1/f noise in BAW quartz resonators , 1992, Proceedings of the 1992 IEEE Frequency Control Symposium.

[4]  Yangyuan Wang,et al.  A 2.4 GHz fully integrated CMOS LC VCO , 2004, Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology, 2004..

[5]  Rich Ruby,et al.  The Effect of Perimeter Geometry on FBAR Resonator Electrical Performance , 2005, IEEE MTT-S International Microwave Symposium Digest, 2005..

[6]  Paul Muralt,et al.  BAW resonators based on aluminum nitride thin films , 1999, 1999 IEEE Ultrasonics Symposium. Proceedings. International Symposium (Cat. No.99CH37027).

[7]  K. Lakin,et al.  Measurement of static and vibration-induced phase noise in UHF thin-film resonator (TFR) filters , 2001, IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control.

[8]  E. Tournier,et al.  AM noise impact on low level phase noise measurements , 2002, IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control.

[9]  K. Lakin,et al.  Thin film resonator technology , 2003, IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control.

[10]  M. Dubois,et al.  Thin film bulk acoustic wave resonators : a technology overview , 2003 .