A Built-In Self-Repair Design for Embedded Memory

The technology of memory built-in self-test(MBIST) about embedded memories is growing more perfect,based on this background,we present a reasonable method for memory built-in self-repair(MBISR),experimental results show that a high repair rate and a low area overhead are achieved with the BISR scheme,such that the embedded memories can be tested and repaired simultaneously,and the performance can be improved dramatically.