Extraction of the induced gate noise, channel thermal noise and their correlation in sub-micron MOSFETs from RF noise measurements

An extraction method to obtain the induced gate noise (i/sub g/i/sub g//sup */), channel thermal noise (i/sub d/i/sub d//sup */) and their cross-correlation (i/sub g/i/sub d//sup */) in submicron MOSFETs directly from scattering and RF noise parameter measurements is presented and experimentally verified. In addition, the extracted induced gate noise, channel thermal noise and their correlation versus frequency, bias condition and channel length are presented.

[1]  Matthias Rudolph,et al.  Experimental evaluation of microwave field-effect-transistor noise models , 1999 .

[2]  Robert W. Dutton,et al.  An accurate and efficient high frequency noise simulation technique for deep submicron MOSFETs , 2000 .

[3]  K. Aufinger,et al.  A Straightforward Noise De-Embedding Method and its Application to High-Speed Silicon Bipolar Transistors , 1996, ESSDERC '96: Proceedings of the 26th European Solid State Device Research Conference.

[4]  R. Twiss,et al.  Nyquist's and Thevenin's Theorems Generalized for Nonreciprocal Linear Networks , 1955 .

[5]  Y. Tsividis.  Operation and modeling of the MOS transistor , 1987 .

[6]  M. J. Deen,et al.  A general procedure for high-frequency noise parameter de-embedding of MOSFETs by taking the capacitive effects of metal interconnections into account , 2001, ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153).

[7]  A. Ziel.  Noise in solid state devices and circuits , 1986 .

[8]  A. Ziel.  Gate noise in field effect transistors at moderately high frequencies , 1963 .

[9]  A. Ziel,et al.  Solid state physical electronics , 1957 .

[10]  Peter Russer,et al.  An efficient method for computer aided noise analysis of linear amplifier networks , 1976 .

[11]  M. J. Deen,et al.  Direct calculation of metal–oxide–semiconductor field effect transistor high frequency noise parameters , 1998 .

[12]  Yuhua Cheng,et al.  Extraction of the channel thermal noise in MOSFETs , 2000, ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095).

[14]  H.R. Rategh,et al.  A 5-GHz CMOS wireless LAN receiver front end , 2000, IEEE Journal of Solid-State Circuits.

[15]  C. Enz,et al.  MOS transistor modeling for RF IC design , 2000, IEEE Journal of Solid-State Circuits.

[16]  Alexios Birbas,et al.  Induced gate noise in MOSFETs revisited: The submicron case , 1997 .

[17]  M. J. Deen,et al.  High frequency noise of MOSFETs I Modeling , 1998 .

[18]  Yuhua Cheng,et al.  High-frequency small signal AC and noise modeling of MOSFETs for RF IC design , 2002 .

[19]  A. Birbas,et al.  Thermal noise modeling for short-channel MOSFETs , 1996 .

[20]  G. Ghione,et al.  Physics-based RF noise modeling of submicron MOSFETs , 1998, International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217).

[21]  Ulrich L. Rohde,et al.  A general noise de-embedding procedure for packaged two-port linear active devices , 1992 .

[22]  M. Jamal Deen,et al.  RF modeling of MOSFETs , 2000, Other Conferences.