Current single event effects and radiation damage results for candidate spacecraft electronics

We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects, proton-induced damage, and total ionizing dose. Devices tested include optoelectronics, digital, analog, linear bipolar, hybrid devices, analog-to-digital converters (ADCs), digital-to-analog converters (DACs), and DC-DC converters, among others.

[1]  E. G. Stassinopoulos,et al.  Proton-induced transients in optocouplers: in-flight anomalies, ground irradiation test, mitigation and implications , 1997 .

[2]  Kenneth A. LaBel,et al.  Anatomy of an in-flight anomaly: investigation of proton-induced SEE test results for stacked IBM DRAMs , 1998 .

[3]  R. Katz,et al.  Current radiation issues for programmable elements and devices , 1998 .

[4]  E. G. Stassinopoulos,et al.  Single event effect test results for candidate spacecraft electronics , 1997, 1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference.

[5]  R. Reed,et al.  Energy dependence of proton damage in AlGaAs light-emitting diodes , 2000 .

[6]  Allan H. Johnston,et al.  Latent damage from single-event latchup , 2002 .

[7]  Charles E. Barnes,et al.  Total dose and proton damage in optocouplers , 1996 .

[8]  K. A. LaBel,et al.  Development of a test methodology for single-event transients (SETs) in linear devices , 2001 .

[9]  K. A. LaBel,et al.  Comparison of MIL-STD-1773 fiber optic data bus terminals: single event proton test irradiation, in-flight space performance, and prediction techniques , 1997 .

[10]  A. H. Johnston,et al.  Emerging radiation hardness assurance (RHA) issues: a NASA approach for space flight programs , 1998 .

[11]  Kenneth A. LaBel,et al.  Single event effect testing of the Intel 80386 family and the 80486 microprocessor , 1995 .

[12]  R. Koga,et al.  Techniques of Microprocessor Testing and SEU-Rate Prediction , 1985, IEEE Transactions on Nuclear Science.

[13]  J. W. Howard,et al.  Proton single event effects (SEE) testing of the Myrinet crossbar switch and network interface card , 2002, IEEE Radiation Effects Data Workshop.

[14]  John D. Cressler,et al.  Single event upset test results on a prescaler fabricated in IBM's 5HP silicon germanium heterojunction bipolar transistors BiCMOS technology , 2001, 2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588).

[15]  J.W. Howard,et al.  Total dose and single event effects testing of the Intel pentium III (P3) and AMD K7 microprocessors , 2001, 2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588).

[16]  A. H. Johnston,et al.  Emerging optocoupler issues with energetic particle-induced transients and permanent radiation degradation , 1998 .