Simulation assisting EMMI technical to locate defect on capacitor in integrated circuit failure analysis

Since the structure and function of IC (Integrated Circuit) is becoming complicated, locating the defect precisely is facing more challenges. Non-destructive analysis strategy would be much more important than ever before. This paper would present an efficient strategy to locate the defect on capacitor with simulation EMMI analysis. This non-destructive strategy can be considered when meet the output signal failed which with complicated feedback circuit.

[1]  Gaojie Wen,et al.  How to Locate Resistance VIA by Analyzing Schematic Combined with EMMI Result on Integrated Circuit Failed at Cold Temperature , 2015 .

[2]  X. Kuang,et al.  Application of EMMI contrast method in failure analysis , 2013, Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

[3]  S. Yao,et al.  Capacitor dielectric defect or damage localization by photon emission microscopy with the combination of OBIRCH , 2013, Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

[4]  Gaojie Wen,et al.  Failure isolation using FIB assist Photon Emission Microscopy analysis and microprobe analysis , 2011, 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).