Compositional Generation of MC/DC Integration Test Suites

Abstract We present a method for automatically generating tests for reactive systems specified by concurrently executing extended finite state machines. The generated test suites satisfy the modified condition/decision coverage criterion at unit and integration levels. The generation of MC/DC suites for eager first-order functional programs is subsumed. An industrial chip card case study illustrates the approach.

[1]  Sanjai Rayadurgam,et al.  Coverage based test-case generation using model checkers , 2001, Proceedings. Eighth Annual IEEE International Conference and Workshop On the Engineering of Computer-Based Systems-ECBS 2001.

[2]  Bernhard Schätz,et al.  Consistent Graphical Specification of Distributed Systems , 1997, FME.

[3]  Alexander Pretschner,et al.  Model based testing in incremental system development , 2004, J. Syst. Softw..

[4]  Hong Zhu,et al.  Software unit test coverage and adequacy , 1997, ACM Comput. Surv..

[5]  Larry Apfelbaum,et al.  Model Based Testing , 1997 .

[6]  Alexander Pretschner,et al.  Model-Based Test Case Generation for Smart Cards , 2003, FMICS.

[7]  Joachim Wegener,et al.  Automatic Test Data Generation For Structural Testing Of Embedded Software Systems By Evolutionary Testing , 2002, GECCO.