Stimuli Generation Techniques for On-Chip Mixed-Signal Test

With increased complexity of the contemporary very large integrated circuits the need for onchip test addressing not only the digital but also analog and mixed-signal RF blocks has emerged. The sta ...

[1]  F. Svelto,et al.  Toward multistandard mobile terminals - fully integrated receivers requirements and architectures , 2005, IEEE Transactions on Microwave Theory and Techniques.

[2]  Edwin W. Greeneich.  Analog Integrated Circuits , 1997, Solid State Science and Engineering Series.

[3]  Manoj Sachdev,et al.  Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits , 2007 .

[4]  H. Tao,et al.  Analysis of timing jitter in bandpass sigma-delta modulators , 1999 .

[5]  S.P. Benz,et al.  Nonlinear Behavior of Electronic Components Characterized With Precision Multitones From a Josephson Arbitrary Waveform Synthesizer , 2009, IEEE Transactions on Applied Superconductivity.

[6]  Thomas H. Lee,et al.  The Design of CMOS Radio-Frequency Integrated Circuits: RF CIRCUITS THROUGH THE AGES , 2003 .

[7]  Gordon W. Roberts,et al.  A frequency response, harmonic distortion, and intermodulation distortion test for BIST of a sigma-delta ADC , 1996 .

[8]  Howard C. Luong,et al.  A 900-MHz CMOS low-phase-noise voltage-controlled ring oscillator , 2001 .

[9]  A. Fard,et al.  A study of phase noise in colpitts and LC-tank CMOS oscillators , 2005, IEEE Journal of Solid-State Circuits.

[10]  Behzad Razavi.  Mutual Injection Pulling Between Oscillators , 2006, IEEE Custom Integrated Circuits Conference 2006.

[11]  Mohammed Ismail,et al.  Multi-Standard CMOS Wireless Receivers: Analysis and Design , 2002 .

[12]  Andreas Wiesbauer,et al.  Nonlinear distortion in current-steering D/A-converters due to asymmetrical switching errors , 2004, 2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512).

[13]  S. Kiaei,et al.  Comparison of contemporary CMOS ring oscillators , 2004, 2004 IEE Radio Frequency Integrated Circuits (RFIC) Systems. Digest of Papers.

[14]  C. L. Searle,et al.  Some aspects of the theory and measurement of frequency fluctuations in frequency standards , 1965 .

[15]  B. Razavi.  A study of injection locking and pulling in oscillators , 2004, IEEE Journal of Solid-State Circuits.

[16]  Beomsup Kim,et al.  A low-noise, 900-MHz VCO in 0.6-/spl mu/m CMOS , 1999 .

[17]  Gordon W. Roberts,et al.  A 4-GHz effective sample rate integrated test core for analog and mixed-signal circuits , 2002, IEEE J. Solid State Circuits.

[18]  Sayfe Kiaei,et al.  A low phase noise 2.0 V 900 MHz CMOS voltage controlled ring oscillator , 2004, 2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512).

[19]  A.P. Chandrakasan,et al.  Ultra low power control circuits for PWM converters , 1997, PESC97. Record 28th Annual IEEE Power Electronics Specialists Conference. Formerly Power Conditioning Specialists Conference 1970-71. Power Processing and Electronic Specialists Conference 1972.

[20]  Jeffrey K. Hollingsworth,et al.  Instrumentation and Measurement , 1998, 2022 International Symposium on Electronics and Telecommunications (ISETC).

[21]  Jaehyok Yi,et al.  Adaptive Digital Feedback Predistortion Technique for Linearizing Power Amplifiers , 2007, IEEE Transactions on Microwave Theory and Techniques.

[22]  Mark Horowitz,et al.  A low power switching power supply for self-clocked systems , 1996, Proceedings of 1996 International Symposium on Low Power Electronics and Design.

[23]  Dilip V. Sarwate,et al.  The frequency spectrum of pulse width modulated signals , 2003, Signal Process..

[24]  Gordon W. Roberts,et al.  On-chip analog signal generator for mixed-signal built-in self-test , 1998, Proceedings of the IEEE 1998 Custom Integrated Circuits Conference (Cat. No.98CH36143).

[25]  R. Adler.  A Study of Locking Phenomena in Oscillators , 1946, Proceedings of the IRE.

[26]  Walt Kester,et al.  Mixed-signal and DSP Design Techniques Analog Devices, Inc. , 2002 .

[27]  Gordon W. Roberts,et al.  An Introduction to Mixed-Signal IC Test and Measurement , 2000 .

[28]  Jerzy Dabrowski,et al.  On-chip stimuli generation for ADC dynamic test by ΣΔ technique , 2009, 2009 European Conference on Circuit Theory and Design.

[29]  Jerzy J. Dabrowski,et al.  Two-tone PLL for on-chip IP3 test , 2010, Proceedings of 2010 IEEE International Symposium on Circuits and Systems.

[30]  Sidney Soclof.  Analog integrated circuits , 1985 .

[31]  Ali Hajimiri,et al.  A general theory of phase noise in electrical oscillators , 1998 .

[32]  G. Avolio,et al.  Inexpensive solution to double RF bandwidth of vector signal generator , 2008, 2008 72nd ARFTG Microwave Measurement Symposium.

[33]  Phil Mellor,et al.  Improved sampling process for a digital, pulse-width modulated, class D power amplifier , 1991 .

[34]  Gabor C. Temes,et al.  Understanding Delta-Sigma Data Converters , 2004 .

[35]  Mi Ae Jang,et al.  An analog linearizer using second harmonic signals feedforwarding , 2005, 2005 European Microwave Conference.

[36]  Joe Kelly,et al.  Production Testing of Rf and System-On-A-Chip Devices for Wireless Communications (Artech House Microwave Library) , 2004 .

[37]  J. Dabrowski,et al.  ADC on-chip dynamic test by PWM technique , 2008, 2008 International Conference on Signals and Electronic Systems.

[38]  Graeme Woodward,et al.  Complete mixed-signal building blocks for single-chip GSM baseband processing , 1998, Proceedings of the IEEE 1998 Custom Integrated Circuits Conference (Cat. No.98CH36143).

[39]  Gordon W. Roberts,et al.  On-chip analog signal generation for mixed-signal built-in self-test , 1999 .

[40]  Anantha Chandrakasan,et al.  A reconfigurable dual output low power digital PWM power converter , 1998, Proceedings. 1998 International Symposium on Low Power Electronics and Design (IEEE Cat. No.98TH8379).

[41]  Bin-Da Liu,et al.  The high-resolution multi-tone signal generators , 2002, Asia-Pacific Conference on Circuits and Systems.

[42]  G. G. Stokes.  "J." , 1890, The New Yale Book of Quotations.

[43]  G.E. Moore,et al.  Cramming More Components Onto Integrated Circuits , 1998, Proceedings of the IEEE.

[44]  Edgar Sanchez-Sinencio,et al.  On-chip ramp generators for mixed-signal BIST and ADC self-test , 2003, IEEE J. Solid State Circuits.

[45]  Y. Cho,et al.  Fixed Point Theory and Applications , 2000 .

[46]  Vishwani D. Agrawal,et al.  Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits [Book Review] , 2000, IEEE Circuits and Devices Magazine.

[47]  A.A. Abidi,et al.  Phase Noise and Jitter in CMOS Ring Oscillators , 2006, IEEE Journal of Solid-State Circuits.

[48]  Ieee Std,et al.  IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters , 2011 .

[49]  Pallab Midya,et al.  Quadrature integral noise shaping for generation of modulated RF signals , 2002, The 2002 45th Midwest Symposium on Circuits and Systems, 2002. MWSCAS-2002..

[50]  Bah-Hwee Gwee,et al.  A micropower low-distortion digital pulsewidth modulator for a digital class D amplifier , 2002 .

[51]  D. Leeson.  A simple model of feedback oscillator noise spectrum , 1966 .

[52]  Gordon W. Roberts,et al.  Techniques for high-frequency integrated test and measurement , 2003, IEEE Trans. Instrum. Meas..

[53]  Behzad Razavi,et al.  A study of phase noise in CMOS oscillators , 1996, IEEE J. Solid State Circuits.

[54]  Roland E. Best.  Phase-Locked Loops , 1984 .

[55]  Leonardo Maria Reyneri,et al.  Fully digital strategy for fast calibration and test of SigmaDelta ADC's , 2007, Microelectron. J..

[56]  Santiago Celma,et al.  Design of a Novel Envelope Detector for Fast-Settling Circuits , 2008, IEEE Transactions on Instrumentation and Measurement.