A six-degree-of-freedom surface encoder for precision positioning of a planar motion stage

Abstract This paper presents a multi-axis surface encoder that can measure six-degree-of-freedom (six-DOF) translational displacement motions and angular motions of a planar motion stage. The six-DOF surface encoder is composed of a planar scale grating and an optical sensor head. A blue laser diode with a wavelength of 405 nm and an output power of 25 mW was employed as the light source of the sensor head. The light rays from the laser diode were collimated to a parallel beam with a diameter of 1.8 mm. The collimated beam was divided by a beam splitter into two beams, which were projected onto the scale grating and a reference grating with an identical grating period of 0.57 μm, respectively. The three-DOF translational displacement motions of the scale grating with respect to the sensor head along the X -, Y - and Z -directions were detected from the interference signals generated by superimposition of the first-order diffraction beams from the two gratings. A part of the zeroth-order and the negative first-order diffraction beams from the scale grating were employed for detection of the three-DOF angular motions about the X -, Y - and Z -axes. The sensor head was designed to have a dimension of 95 mm ( X ) × 90 mm ( Y ) × 25 mm ( Z ) so that it can be mounted on a previously developed planar motion stage. The grating area of the scale grating was designed to be 60 mm ( X ) × 60 mm ( Y ), which was larger than the stage moving ranges of 40 mm ( X ) × 40 mm ( Y ). Experiments were carried out to test the basic performances of the surface encoder.

[1]  Wei Ph. D. Gao Precision Nanometrology: Sensors and Measuring Systems for Nanomanufacturing , 2010 .

[2]  Fumiaki Satoh,et al.  A surface motor-driven precise positioning system , 1994 .

[3]  P. Klapetek,et al.  A long-range scanning probe microscope for automotive reflector optical quality inspection , 2011 .

[4]  Yuichi Okazaki,et al.  Precision nano-fabrication and evaluation of a large area sinusoidal grid surface for a surface encoder , 2003 .

[5]  Lijiang Zeng,et al.  A sub-nanometric three-axis surface encoder with short-period planar gratings for stage motion measurement , 2012 .

[6]  Tilo Pfeifer,et al.  Scales vs. laser interferometers performance and comparison of two measuring systems , 1993 .

[8]  Shuichi Dejima,et al.  A surface motor-driven planar motion stage integrated with an XYθZ surface encoder for precision positioning , 2004 .

[9]  David L. Trumper,et al.  High-precision magnetic levitation stage for photolithography , 1998 .

[10]  K. Fan,et al.  A 6-degree-of-freedom measurement system for the accuracy of X-Y stages , 2000 .

[11]  Lifeng Li,et al.  New formulation of the Fourier modal method for crossed surface-relief gratings , 1997 .

[12]  Wei Gao,et al.  A Three-axis Displacement Sensor with Nanometric Resolution , 2007 .

[13]  Eiji Shamoto,et al.  Ultraprecision 6-Axis Table Driven by Means of Walking Drive , 2000 .

[14]  Robert Schmitt,et al.  Geometric error measurement and compensation of machines : an update , 2008 .

[15]  David L. Trumper,et al.  The long-range scanning stage: a novel platform for scanned-probe microscopy , 2000 .

[16]  David L. Trumper,et al.  Dynamics and Control of the UNCC/MIT Sub-Atomic Measuring Machine , 2001 .

[17]  Huzefa Shakir,et al.  Design and precision construction of novel magnetic-levitation-based multi-axis nanoscale positioning systems , 2007 .

[18]  Yoshikazu Arai,et al.  Design and construction of a two-degree-of-freedom linear encoder for nanometric measurement of stage position and straightness , 2010 .

[19]  Yucheng Ding,et al.  Review of the wafer stage for nanoimprint lithography , 2007 .

[20]  C. R. Steinmetz,et al.  Sub-micron position measurement and control on precision machine tools with laser interferometry , 1990 .

[21]  Chia-Hsiang Menq,et al.  Modeling and control of a six-axis precision motion control stage , 2005 .

[22]  Wim Dewulf,et al.  A test object with parallel grooves for calibration and accuracy assessment of industrial CT metrology , 2011 .

[23]  Dan J. Gordon,et al.  Precision machine tool X–Y stage utilizing a planar air bearing arrangement , 2010 .

[24]  J. B. Bryan,et al.  The Abbé principle revisited: An updated interpretation , 1979 .

[25]  Chek Sing Teo,et al.  Dynamic modeling and adaptive control of a H-type gantry stage , 2007 .

[26]  Wei Gao,et al.  A three-axis autocollimator for detection of angular error motions of a precision stage , 2011 .