论文信息 - Direct Measurement of SET Pulse Widths in 0.2- $\mu$m SOI Logic Cells Irradiated by Heavy Ions

Direct Measurement of SET Pulse Widths in 0.2- $\mu$m SOI Logic Cells Irradiated by Heavy Ions

Heavy-ion-induced SET-pulse widths in NOR-logic cells fabricated by a 0.2-mum FD-SOI technology are directly measured by using an on-chip self-triggering flip-flop circuit. The pulse widths are distributed from 0.3 to 1.0 ns under a constant LET of 40 MeVmiddot cm 2/mg

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