RFテスタ用リフレクトメータのSiP化技術;RFテスタ用リフレクトメータのSiP化技術;RF-SiP Technology of Reflect-meter for RF Testers

[1]  A. Davidson,et al.  Achieving greater on-wafer S-parameter accuracy with the LRM calibration technique , 1989, 34th ARFTG Conference Digest.

[2]  Barrie Gilbert,et al.  A precise four-quadrant multiplier with subnanosecond response , 1968, IEEE Solid-State Circuits Newsletter.

[3]  M. Kimishima.  Introduction to latest RF test technologies in RF ATE for low test cost and high throughput , 2011, 2011 China-Japan Joint Microwave Conference.

[4]  J. Schellenberg,et al.  Low-loss, planar monolithic baluns for K/Ka-band applications , 1999, 1999 IEEE MTT-S International Microwave Symposium Digest (Cat. No.99CH36282).

[5]  J. Shelton.  Impedances of Offset Parallel-Coupled Strip Transmission Lines , 1966 .

[6]  Robert G. Meyer,et al.  Intermodulation in high-frequency bipolar transistor integrated-circuit mixers , 1986 .

[7]  R. Levy,et al.  General Synthesis of Asymmetric Multi-Element Coupled-Transmission-Line Directional Couplers , 1963 .

[8]  S. Kimura,et al.  0-40 GHz GaAs MESFET distributed baseband amplifier ICs for high-speed optical transmission , 1996 .

[9]  Jaewoo Park,et al.  A 2x2 MIMO Tri-Band Dual-Mode Direct-Conversion CMOS Transceiver for Worldwide WiMAX/WLAN Applications , 2011, IEEE Journal of Solid-State Circuits.

[10]  Ahmad Mirzaei,et al.  A 65 nm CMOS Quad-Band SAW-Less Receiver SoC for GSM/GPRS/EDGE , 2011, IEEE Journal of Solid-State Circuits.

[11]  Masayuki Kimishima,et al.  A high density small size RF test module for high throughput multiple resource testing , 2010, 2010 IEEE International Test Conference.

[12]  Jie-Wei Lai,et al.  A world-band triple-mode 802.11a/b/g SOC in 0.13um CMOS , 2008, 2008 IEEE Asian Solid-State Circuits Conference.

[13]  Kyung-Whan Yeom,et al.  A novel planar dual balun for Doubly Balanced star mixer , 2004 .

[14]  Masayuki Kimishima.  Introduction to Latest RF ATE with Low Test Cost Solutions , 2012, IEICE Trans. Electron..