论文信息 - Mechanism of Electron Trapping and Characteristics of Traps in $\hbox{HfO}_{2}$ Gate Stacks - 字舞流文

Mechanism of Electron Trapping and Characteristics of Traps in $\hbox{HfO}_{2}$ Gate Stacks

Chang Seo Park | G. Bersuker | B. Lee | R. Choi | J. Sim | C. Young | S. Nadkarni | J. H. Sim