Reliability of Power Electronics Under Thermal Loading
暂无分享,去创建一个
[1] J. Lahti,et al. The Characteristic Wearout Process in Epoxy-Glass Printed Circuits for High Density Electronic Packaging , 1979, 17th International Reliability Physics Symposium.
[2] S. J. Krumbein,et al. Metallic electromigration phenomena , 1988 .
[3] Pedro O. Quintero,et al. Silver-Indium Transient Liquid Phase Sintering for High Temperature Die Attachment , 2009 .
[4] Michael Clode,et al. Molten solder interconnects: Long term reaction studies and applications , 2004 .
[5] Guo-Quan Lu,et al. Pressure-assisted low-temperature sintering of silver paste as an alternative die-attach solution to solder reflow , 2002 .
[6] Randall Kirschman,et al. High Temperature Aluminum Nitride Packaging , 1999 .
[7] J. Mitchell,et al. Conductive Anodic Filaments in Reinforced Polymeric Dielectrics: Formation and Prevention , 1979, 17th International Reliability Physics Symposium.
[8] N. Lee,et al. Getting Ready for Lead‐free Solders* , 1997 .
[9] F. P. McCluskey,et al. Temperature Cycling Reliability of High-Temperature Lead-Free Die-Attach Technologies , 2011, IEEE Transactions on Device and Materials Reliability.
[10] J.D. van Wyk,et al. A study of thermal stress and intrinsic residual stress in planar metallization for integrated power modules , 2005, IEEE Transactions on Industry Applications.
[11] B. Rudra,et al. Failure-mechanism models for conductive-filament formation , 1994 .
[12] Sungho Jin,et al. Developing lead-free solders: A challenge and opportunity , 1993 .
[13] J.D. Van Wyk,et al. Thermal-mechanical stress analysis in embedded power modules , 2004, 2004 IEEE 35th Annual Power Electronics Specialists Conference (IEEE Cat. No.04CH37551).
[14] Patrick McCluskey,et al. Wire Flexure Fatigue Model for Asymmetric Bond Height , 2003 .
[15] M. Pecht,et al. Conductive Filament Formation In Printed Wiring Boards , 1992, Thirteenth IEEE/CHMT International Electronics Manufacturing Technology Symposium.
[16] P. McCluskey,et al. High Temperature Lead-Free Attach Reliability , 2007 .
[17] Michael Pecht,et al. Assessing time-to-failure due to conductive filament formation in multi-layer organic laminates , 1994 .
[18] K. Meyyappan,et al. Wire Fatigue Models for Power Electronic Modules , 2003 .
[19] Dirk Siepe,et al. New assembly and interconnects beyond sintering methods , 2010 .
[20] M. Hansen,et al. Constitution of Binary Alloys , 1958 .
[21] G. T. Kohman,et al. Silver migration in electrical insulation , 1955 .
[22] H. Schwarzbauer,et al. Novel large area joining technique for improved power device performance , 1989, Conference Record of the IEEE Industry Applications Society Annual Meeting,.
[23] Charles A. Harper. Handbook of Electronic Packaging , 1969 .
[24] N. Chidambaram,et al. A numerical and experimental study of temperature cycle wire bond failure , 1991, 1991 Proceedings 41st Electronic Components & Technology Conference.
[25] Thomas Stockmeier,et al. SKiN: Double side sintering technology for new packages , 2011, 2011 IEEE 23rd International Symposium on Power Semiconductor Devices and ICs.
[26] Hamid Hadim,et al. Handbook of Electronic Packaging Design , 1992 .