An Optimal Algorithm for Testing Stuck-at Faults in Random Access Memories

This correspondence presents an optimal algorithm to detect any single "stuck-at-i," "stuck-at-O" fault and any combination of "stuck-at-I," "stuck-at-O" multiple faults in a random access memory using only the n-bit memory address register input and m-bit memory buffer register input and output lines. It is shown that this algorithm requires 4 X 2n memory accesses.