论文信息 - Investigation in lifetime evaluation of electron multiplier based on step stress accelerated degradation test in a two-way design

Investigation in lifetime evaluation of electron multiplier based on step stress accelerated degradation test in a two-way design

In order to evaluate lifetime of electron multiplier(EM), which is a key component of a cesium atomic frequency standard system, step stress accelerated degradation test in a two-way design is presented. The investigation of test design, establishment of lifetime evaluation model and model analyses is made. Then lifetime evaluation of EM is carried out.

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