论文信息 - Low-frequency noise used as a lifetime test of LEDs

Low-frequency noise used as a lifetime test of LEDs

Low-frequency noise (1/f noise) has been measured in light emitting diodes (LEDs) which have been subjected to an accelerated life test by means of large forward bias current pulses. Over a large range of stress pulses the electrical and functional LED properties remain unaltered but an increase in the 1/f noise level was seen and this was correlated with the device reliability. The product `initial noise X initial rate of noise increase' correlated best with the LED lifetime.

Doru Ursutiu | B. Jones | B K Jones | D. Ursuțiu

[1] L.K.J. Vandamme,et al. 1/f noise as a reliability estimation for solar cells , 1983 .

[2] Yiqi Zhuang,et al. Correlation between 1/f noise and h/sub FE/ long-term instability in silicon bipolar devices , 1991 .

[3] B. Jones,et al. The apparent degradation of mobility in field-effect-device channels , 1986 .

[4] Yisong Dai,et al. A dynamic noise measurement technique used to estimate activation energies for failure mechanisms of a transistor , 1993 .

[5] T. Kleinpenning. 1f Noise in p-n diodes , 1980 .

[6] B. K. Jones,et al. Electrical Noise as a Measure of Quality and Reliability in Electronic Devices , 1993 .

[7] Dai Yisong,et al. An improved approach and experimental results of a low-frequency noise measurement technique used for reliability estimation of diode lasers , 1994 .

[8] E.S.C. Mzunzu,et al. The stability of polycrystalline silicon thin film resistors measured using excess noise , 1989 .