Study on conducted EMI noise source modelling applied in electromagnetic compatibility analysis based on GA in cooperation with LM

In this study, a new method employing scattering parameters (SPs) method, genetic algorithm (GA) and Levenberg–Marquardt algorithm (LM) is proposed for modelling conducted electromagnetic interference (EMI) noise source impedance. On the basis of the impedance information extracted by traditional SP method, GA is adopted to optimise the impedance information by taking advantage of the fast convergence speed. The obtained values of the RCL parameter are used as a set of initial values. Then, by using the advantage of the high precision of the LM, the initial values obtained by the GA are iteratively calculated. Better results can be obtained by using this combination method. This method improves the processing accuracy while ensuring the processing speed and contributes to the design of conduction EMI filter.

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