Temperature dependence of frequency dispersion in III–V metal-oxide-semiconductor C-V and the capture/emission process of border traps
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J. Raskin | A. Thean | N. Collaert | T. Ivanov | K. Martens | A. Vais | J. Maes | Q. Xie | M. Givens | F. Tang | K. Demeyer | H. Lin | C. Dou | H. Lin
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