Differential aperture x-ray microscopy near Te precipitates in CdZnTe

We report the results of Differential Aperture X-ray Microscopy (DAXM) measurements near Te precipitates in CdZnTe grown via low-pressure Bridgman. White-beam Laue patterns were acquired with 3-D spatial resolution (with 0.25 μm resolution in the scanning directions and 1 μm resolution in depth) at depths of up to 35 μm deep normal to the surface. We find very little crystal strain (< 10-3) or rotation (<0.05 degrees) near Te precipitates. We also examine local deformations in the vicinity of a microhardness indent, and find that although significant rotations exist, the spatial extent is limited to a few tens of microns. Furthermore, observed crystal strains are limited to 5 x 10-3 or less in regions near the microhardness indent.