论文信息 - Thickness Mediated Morphology Evolution in Sub-10-nm Metal Film Deposition: Implications for Nondestructive Testing - 字舞流文

Thickness Mediated Morphology Evolution in Sub-10-nm Metal Film Deposition: Implications for Nondestructive Testing

S. Luo | Zhiliang Zhang | B. Skallerud | Senbo Xiao | Jibo He | H. Kristiansen | Yuequn Fu | Siqi Liu | Feng Wang