Structure of the carrot defect in 4H-SiC epitaxial layers
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Marek Skowronski | Pierre Ruterana | Mourad Benamara | Michael J. O'Loughlin | J. Sumakeris | M. Paisley | M. O'loughlin | M. Skowronski | P. Ruterana | G. Nouet | M. Benamara | Gerard Nouet | X. Zhang | Joseph John Sumakeris | X. Zhang | Michael James Paisley
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