Global Template Projection and Matching Method for Training-Free Analysis of Delayered IC Images
暂无分享,去创建一个
[1] Sanjay Kumar Dubey,et al. Comparative Analysis of K-Means and Fuzzy C- Means Algorithms , 2013 .
[2] Bah-Hwee Gwee,et al. A Hierarchical Multiclassifier System for Automated Analysis of Delayered IC Images , 2019, IEEE Intelligent Systems.
[3] Bah-Hwee Gwee,et al. Hybrid ${K}$ -Means Clustering and Support Vector Machine Method for via and Metal Line Detections in Delayered IC Images , 2018, IEEE Transactions on Circuits and Systems II: Express Briefs.
[4] Bah-Hwee Gwee,et al. Deep Learning for Automatic IC Image Analysis , 2018, 2018 IEEE 23rd International Conference on Digital Signal Processing (DSP).
[5] Dick James,et al. The State-of-the-Art in IC Reverse Engineering , 2009, CHES.
[6] Motilal Agrawal,et al. Non-Invasive Recognition of Poorly Resolved Integrated Circuit Elements , 2014, IEEE Transactions on Information Forensics and Security.
[7] Jayaram K. Udupa,et al. A framework for evaluating image segmentation algorithms , 2006, Comput. Medical Imaging Graph..
[8] Juraj Horváth,et al. Image Segmentation Using Fuzzy C-Means , 2005 .
[9] Kar-Ann Toh,et al. Finger-knuckle-print for identity verification based on difference images , 2016, 2016 IEEE 11th Conference on Industrial Electronics and Applications (ICIEA).
[10] Prasanta K. Panigrahi,et al. Multilevel thresholding for image segmentation through a fast statistical recursive algorithm , 2006, Pattern Recognit. Lett..
[11] Francesc Tarres,et al. The use of digital image processing for IC reverse engineering , 2014, 2014 IEEE 11th International Multi-Conference on Systems, Signals & Devices (SSD14).