I-V measurement of NiO nanoregion during observation by transmission electron microscopy
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M. Moniwa | Yasuo Takahashi | T. Fujii | M. Arita | K. Hamada | I. Fujiwara | Y. Maeno | Toshio Kobayashi | H. Kondo | Takeshi Yamaguchi | M. Yoshimaru | M. Aoki | H. Kaji