Time-resolved surface scattering imaging of organic liquids under femtosecond KrF laser pulse excitation
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Hiroshi Masuhara | Tamitake Itoh | Koji Hatanaka | Hiroshi Fukumura | Tsuneo Sasuga | S. Kawanishi | Tsuyoshi Asahi | T. Itoh | H. Masuhara | N. Ichinose | K. Hatanaka | S. Kawanishi | T. Asahi | H. Fukumura | Nobuyuki Ichinose | T. Sasuga
[1] H. E. Bennett,et al. Relation between Surface Roughness and Specular Reflectance at Normal Incidence , 1961 .
[2] P. Simon,et al. Nanosecond and femtosecond excimer laser ablation of fused silica , 1992 .
[3] M. Lagally,et al. Comparison of surface roughness of polished silicon wafers measured by light scattering topography, soft‐x‐ray scattering, and atomic‐force microscopy , 1995 .
[4] Roland Sauerbrey,et al. Femtosecond excimer-laser-induced structure formation on polymers , 1994 .
[5] Michael C. Downer,et al. Femtosecond imaging of melting and evaporation at a photoexcited silicon surface , 1985 .
[6] H. Masuhara,et al. The 248-nm excimer-laser-ablation mechanism of liquid benzene derivatives: Photochemical formation of benzyl radical leads to ablation , 1998 .
[7] J. P. Rahn,et al. Relationship of the total integrated scattering from multilayer-coated optics to angle of incidence, polarization, correlation length, and roughness cross-correlation properties. , 1983, Applied optics.
[8] L. S. Bennett,et al. Laser induced microexplosions of a photosensitive polymer , 1996 .
[9] H. Masuhara,et al. Switching from photochemical to photothermal mechanism in laser ablation of benzene solutions , 1997 .